Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness
โ Scribed by Dreher, A.; Ioffe, A.
- Book ID
- 119789100
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 106 KB
- Volume
- 10
- Category
- Article
- ISSN
- 1051-8207
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
## Abstract A new, efficient method of moments (MoM) is developed for accurate, fullโwave analysis of microstrip components and circuits. The new method is applied for the analysis of a twoโgap filter. The new method is found to be as accurate as conventional moment methods, and also significantly
โ ท As compared to the Gaussian approach, the point of peak power is higher, and occurs for higher values of h. โ ท In the ascending flank of the curves, particularly in the range 0.25hrh -0.75 where the sensor sensitivity ref S s ัจ P rัจ h is higher and linearity errors are smaller, it n is observed tha