Analysis of microhardness data in TlxIn1−xSe

✍ Scribed by I. Y. Yanchev; E. P. Trifonova; Ch. Karakotsou; A. N. Anagnostopoulos; G. L. Bleris

• Book ID: 104738122
• Publisher: Springer
• Year: 1995
• Tongue: English
• Weight: 458 KB
• Volume: 30
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1007/bf00356689

✦ Synopsis

Microhardness measurements have been performed on TlxlnvxSe semiconductors (x= 0.0,0.2,0.3 ... 1.0). The microhardness, H, as a function of xshows a maximum at xca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected, a polynomial one.