๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A statistical analysis of microhardness data in boron softened Ni3Al

โœ Scribed by X.R. Qian; Y.T. Chou

Book ID
117211039
Publisher
Elsevier Science
Year
1988
Weight
112 KB
Volume
22
Category
Article
ISSN
0036-9748

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Analysis of microhardness data in TlxIn1
Analysis of microhardness data in TlxIn1โˆ’xSe
โœ I. Y. Yanchev; E. P. Trifonova; Ch. Karakotsou; A. N. Anagnostopoulos; G. L. Ble ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Springer ๐ŸŒ English โš– 458 KB

Microhardness measurements have been performed on TlxlnvxSe semiconductors (x= 0.0,0.2,0.3 ... 1.0). The microhardness, H, as a function of xshows a maximum at xca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected,

Features of the microhardness near rando
Features of the microhardness near random and special type of boundaries in a Ni3Al intermetallic compound
โœ E.V. Konovalova; O.B. Perevalova; N.A. Koneva; E.V. Kozlov ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 340 KB

Various types of the grain boundaries were identified in intermetallic compound Ni 3 Al polycrystals. Deviations from the stoichiometric composition were determined, and microhardness was measured inside the grains and at grain boundaries. Microhardness near special boundaries is smaller than near r