𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Analysis of Metal–Insulator–Metal Structure and Its Application to Sensor

✍ Scribed by Tamura, Masaya; Kagata, Hiroshi

Book ID
121876084
Publisher
IEEE
Year
2010
Tongue
English
Weight
894 KB
Category
Article
ISSN
0018-9480

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Method of metal-insulator-semiconductor
Method of metal-insulator-semiconductor structure interface analysis
✍ Bondarenko, G. G.; Andreev, V. V.; Loskutov, S. A.; Stolyarov, A. A. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 79 KB 👁 1 views

The method of metal-insulator-semiconductor (MIS) structure interface analysis, based on applying a direct current pulse of preset amplitude to a MIS structure, is proposed. The variation of the voltage across the MIS structure is recorded while the current flows. The method allows measurement of in