Short range correlations of misfit dislo
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Kaganer, Vladimir M. ;Sabelfeld, Karl K.
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Article
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2011
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John Wiley and Sons
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English
⚖ 216 KB
## Abstract The X‐ray diffraction peak profiles due to misfit dislocations are studied for the dislocations correlated on distances much smaller than the film thickness. Simple analytical expressions for the correlation parameter are obtained when the dislocations are generated as a Markov chain. M