✦ LIBER ✦

Analysis of high-Tc superconducting thin films by means of secondary neutral mass spectrometry

✍ Scribed by Ulrich Schneider

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of ion-beam- and magnet

✍ C. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 410 KB

Absolute depth profiling of thin film sy

✍ A. Wucher; H. Oechsner; F. Novak 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 234 KB

High Tc superconducting thin films: An a

✍ P. Calvani; M. Capizzi; S. Lupi; P. Maselli; E. Agostinelli 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 201 KB

Depth profiling of thin film heterostruc

✍ EO Ristolainen; M Puga-Lambers; B Panthangay; PH Holloway 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 433 KB

Surface analysis of dielectric films by

✍ M Leisch 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 330 KB

Direct analysis of thin-layer chromatogr

✍ Kenneth L. Busch 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 818 KB