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Analysis of distributed resistance effects in MOS transistors

โœ Scribed by Horan, J.; Lyden, C.; Mathewson, A.; Cahill, C.G.; Lane, W.A.


Book ID
119777653
Publisher
IEEE
Year
1989
Tongue
English
Weight
477 KB
Volume
8
Category
Article
ISSN
0278-0070

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