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Analysis of degraded papers by non-destructive spectroscopic techniques

โœ Scribed by Marina Bicchieri; Armida Sodo; Giovanna Piantanida; Carlo Coluzza

Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
600 KB
Volume
37
Category
Article
ISSN
0377-0486

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New spectroscopic ellipsometry techniques are very promising for the non-destructive surface analysis of thin films on metals. Infrared spectroscopic ellipsometry allows the morphological and chemical characterization of these films, and recent results are presented here.