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Analysis of Critical Voltage Data Using the Dynamical Theory of Electron Diffraction

✍ Scribed by H. S. Kim; S. S. Sheinin

Publisher: John Wiley and Sons
Year: 1983
Tongue: English
Weight: 663 KB
Volume: 120
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.2221200132

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