The real space method for dynamical electron diffraction calculations in high resolution electron microscopy: II. Critical analysis of the dependency on the input parameters

✍ Scribed by W. Coene; D. Van Dyck

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 737 KB
• Volume: 15
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(84)90073-1