𝔖 Bobbio Scriptorium

✦ LIBER ✦

Analysis of CMOS transistor instabilities : S. Dimitrijev and N. Stoijadinovic. Solid-St. Electron.30, 991 (1987)

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 219 KB
Volume: 28
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(88)90023-6

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Performance analysis of sub-micron gate

Performance analysis of sub-micron gate GaAs MESFETS : O. L. El-Sayed, S. El-Ghazaly, G. Salmer and M. Lefebvre. Solid-St. Electron.30, 643 (1987)

📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 122 KB

Fabrication and characteristics of tin-d

Fabrication and characteristics of tin-doped n-layers into gallium arsenide by an open-tube diffusion process: P. J. Ledakovitch, R. Agarwal and S. K. Ghandhi. Solid-St. Electron.30, 681 (1987)

📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 132 KB