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Analysis of circuit degradation due to hot-carrier effects in 64Mb DRAMs

✍ Scribed by Yoonjong Huh; Dooyoung Yang; Yungkwon Sung

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 455 KB
Volume: 39
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(96)00062-7

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