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Analysis of Admittance Data: Comparison of a Parametric and a Nonparametric Method

โœ Scribed by J. Winterhalter; D.G. Ebling; D. Maier; J. Honerkamp

Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
137 KB
Volume
153
Category
Article
ISSN
0021-9991

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โœฆ Synopsis

The thermal relaxation times are characteristic parameters of deep levels which can be calculated by the analysis of admittance data. The contributions of these characteristic parameters can be sharp or broadened. If sharp contributions are assumed the analysis procedure is called a parametric method. This procedure leads to a wellposed inverse problem but additionally the unknown number of discrete contributions must be determined. For broadened contributions a nonparametric method is used. This procedure leads to an ill-posed inverse problem but the number of contributions is determined automatically. Both kinds of analysis methods are compared with a Monte Carlo study on simulated admittance data. In addition, the parametric and nonparametric procedures are used to analyze experimental admittance data in order to obtain the deep levels and electrical properties of a semi-insulating GaAs Schottky diode.

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