Using the single-layer reduction SLR formulation, the slow wa¨e on a multilayer microstrip is analyzed. New results on a suspended, shielded, and dielectric-co¨ered slow-wa¨e microstrip line are presented. The accuracy of the model has been tested against the ( ) spectral-domain analysis SDA and the
Analysis and circuit model of a multilayer semiconductor slow-wave microstrip line
✍ Scribed by Verma, A.K.; Nasimuddin; Sharma, E.K.
- Book ID
- 114455349
- Publisher
- The Institution of Electrical Engineers
- Year
- 2004
- Tongue
- English
- Weight
- 450 KB
- Volume
- 151
- Category
- Article
- ISSN
- 1350-2417
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## Abstract The present paper computes the normalized phase constant, dielectric loss, and conductor loss of the voltage‐controlled Schottky‐contact microstrip line using the variational method based on the single‐layer reduction (SLR) formulation. Results computed by the SLR formulation show very
## Abstract The attenuation and slow‐wave characteristics in an inverted embedded metal‐insulator‐semiconductor (IEM‐MIS) microstrip line are investigated in this paper, based on the extracted frequency‐dependent distributed parameters, that is, per‐unit‐length series resistance and inductance, shu