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An XPS study of X-ray-induced dehydrochlorination of oxygen-free PVC

โœ Scribed by H.P. Chang; J.H. Thomas III

Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
732 KB
Volume
26
Category
Article
ISSN
0368-2048

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XPS and x-ray-induced AES have been used to study the reaction layers formed on silicon powder samples heated in ultra-high purity nitrogen at temperatures between 1100 and 1200 "C. An equation was derived to calculate the average surface reaction layer thicknesses from the silicon AES spectra. The