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An XPS study of dispersion and valence state of TiO2supported vanadium oxide catalysts

✍ Scribed by S. Lars; T. Andersson


Book ID
112400540
Publisher
Springer US
Year
1991
Tongue
English
Weight
447 KB
Volume
7
Category
Article
ISSN
1011-372X

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Substrate Effects and Chemical State Plo
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The analysis by XPS of deposited on di †erent substrates MgO, Ag, SnO) shows the existence of TiO 2 (SiO 2 , shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is p