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An XPS investigation of titanium dioxide thin films on polycrystalline platinum

โœ Scribed by Greenlief, C. M.; White, J. M.; Ko, C. S.; Gorte, R. J.


Book ID
120325272
Publisher
American Chemical Society
Year
1985
Tongue
English
Weight
470 KB
Volume
89
Category
Article
ISSN
0022-3654

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๐Ÿ“œ SIMILAR VOLUMES


An XPS study of GaN thin films on GaAs
โœ R. Carin; J. P. Deville; J. Werckmann ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 476 KB

## Abstract The energies of photoelectron and Auger lines of gallium and nitrogen in GaN thin films obtained by reactive sputtering are derived. From previous RBS investigations, such were found to be stoichiometric in the bulk. The XPS surface analysis of the films gives a chemical content of โˆผ20%