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An X-ray scattering study of SiOx/Si/Ge(001)

✍ Scribed by S.D. Kosowsky; C.-H. Hsu; P.S. Pershan; J. Bevk; B.S. Freer

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 526 KB
Volume: 84
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(94)00475-7

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