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An X-ray photoelectron spectroscopic study of novel SiON glasses

✍ Scribed by R. Franke; C. Girgenrath; S. Kohn; M. Jansen

Publisher: Springer
Year: 1998
Tongue: English
Weight: 108 KB
Volume: 361
Category: Article
ISSN: 1618-2650
DOI: 10.1007/s002160050957

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