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An X-ray diffractometer for studying the effect of external fields on the structure and electron distribution of single crystals

โœ Scribed by Aslanov, L. A. ;Trunov, V. A. ;Fetisov, G. V. ;Priemyshev, V. A. ;Rybakov, V. B. ;Kasman, Ya. A. ;Bulkin, A. P.


Book ID
114500185
Publisher
International Union of Crystallography
Year
1989
Tongue
English
Weight
450 KB
Volume
22
Category
Article
ISSN
0021-8898

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