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An X-ray diffraction profile analysis of vacuum-evaporated copper films: normal and oblique vapour incidence

โœ Scribed by Halder, S K; Sen, Suchitra; Gupta, S P Sen


Book ID
120648002
Publisher
Institute of Physics
Year
1976
Tongue
English
Weight
799 KB
Volume
9
Category
Article
ISSN
0022-3727

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