An ultrathin buried Si layer in GaAs studied by soft X-ray emission spectroscopy and surface X-ray diffraction: theory and experiment

✍ Scribed by P.O. Nilsson; S. Mankefors; E. Lundgren

• Book ID: 117625223
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 333 KB
• Volume: 286
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/s0925-8388(98)00976-1