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✦   LIBER   ✦

An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite

✍ Scribed by Y. J. Chen; I. H. Wilson; J. B. Xu; Lin Libin

Book ID
111534742
Publisher
Springer
Year
1998
Tongue
English
Weight
295 KB
Volume
33
Category
Article
ISSN
0022-2461

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The effect of bismuth ion implantation (dose range 10 15 -10 18 cm -2 ) on the surface morphology of monocrystalline silicon was investigated by Atomic Force Microscopy (AFM) and Cross-Sectional Transmission Electron Microscopy (XTEM) and the data obtained compared. The low levels of roughness obser