An overview of thickness measurement techniques for metallic thin films: Sheldon C. P. Lim and Doug Ridley Solid St. Technol., 99 (February 1983)

• Book ID: 104157394
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 102 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80251-2