✦ LIBER ✦
An overview of thickness measurement techniques for metallic thin films : Sheldon C. P. Lim and Doug Ridley. Solid St. Technol., 99 (February 1983)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 124 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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