An Optimized and Reliable LDD Structure for 1-/spl mu/m NMOSFET Based on Substrate Current Analysis

✍ Scribed by Matsumoto, Y.; Higuchi, T.; Mizuno, T.; Sawada, S.; Shinozaki, S.; Ozawa, O.

• Book ID: 119798432
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 724 KB
• Volume: 20
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.1985.1052313