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An ONP Investigation of Deep Level Defects Produced by Heat Treatmentat 600 and 800 °C in CzSi

✍ Scribed by Bagraev, N. T. ;Polovtsev, I. S. ;Scumalz, K.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

DLTS study of deep level defects in Cz n

✍ Schmalz, K. ;Kirscht, F.-G. ;Tittelbach-Helmrich, K. 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 922 KB

DLTS study on deep level defects in Cz-p

✍ Schmalz, K. ;Kirscht, F.-G. ;Klose, H. ;Richter, H. ;Tittelbach-Helmrich, K. 📂 Article 📅 1987 🏛 John Wiley and Sons 🌐 English ⚖ 980 KB