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An investigation of the Al2O3-CdSe interface in accumulation

✍ Scribed by A. van Calster; Li Yu-Min

Publisher
Springer
Year
1980
Tongue
English
Weight
381 KB
Volume
23
Category
Article
ISSN
1432-0630

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The Ti/AI203 (1 1 0 2) interface formation has been investigated by X-ray photoelectron spectroscopy and Auger electron spectroscopy (AES). The results showed that when an active metal titanium was evaporated on to a room-temperature AI203 (1 1-0 2) surface in ultrahigh vaccum, a Ti/AI203 interface