An investigation of excess noise in transition-edge sensors on a solid silicon substrate

✍ Scribed by S.G. Crowder; M.A. Lindeman; M.B. Anderson; S.R. Bandler; N. Bilgri; M.P. Bruijn; J. Chervenak; E. Figueroa-Feliciano; F. Finkbeiner; A. Germeau; H.F.C. Hoevers; N. Iyomoto; R. Kelly; C.A. Kilbourne; T. Lai; J. Man; D. McCammon; K.L. Nelms; F.S. Porter; L. Rocks; T. Saab; J. Sadleir; G. Vidugiris

• Book ID: 108219518
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 168 KB
• Volume: 559
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2005.12.117