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An integration method for the analysis of multiexponential transient signals

โœ Scribed by Tittelbach-Helmrich, K


Book ID
121343828
Publisher
Institute of Physics
Year
1993
Tongue
English
Weight
514 KB
Volume
4
Category
Article
ISSN
0957-0233

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โœ M. Hanine; M. Masmoudi; J. Marcon ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 184 KB

In this paper, a reliable procedure, which allows a fine as well as a robust analysis of the deep defects in semiconductors, is detailed. In this procedure where capacitance transients are considered as multiexponential and corrupted with Gaussian noise, our new method of analysis, the Levenberg-Mar