A reliable procedure for the analysis of
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M. Hanine; M. Masmoudi; J. Marcon
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Article
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2004
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Elsevier Science
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English
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In this paper, a reliable procedure, which allows a fine as well as a robust analysis of the deep defects in semiconductors, is detailed. In this procedure where capacitance transients are considered as multiexponential and corrupted with Gaussian noise, our new method of analysis, the Levenberg-Mar