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An instrumental solution to the phenomenon of negative capacitances in semiconductors

✍ Scribed by K.S.A Butcher; T.L Tansley; D Alexiev


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
417 KB
Volume
39
Category
Article
ISSN
0038-1101

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The design and operation of an instrument for the direct, continuous monitoring of electrode capacitance under potentiostatic conditions is described. Accurate values of the capacitance can bc obtained over two orders of magnitude of capacitance, even in the presence of low parallel resistances.