An in situ X-ray scattering study of high-temperature structural changes in Bi2Sr2CaCu2O8+δ
✍ Scribed by S.T. Johnson; P.D. Hatton
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 778 KB
- Volume
- 270
- Category
- Article
- ISSN
- 0921-4534
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The present work reports new features of an X-ray diffraction pattern from Bi-Sr-Ca-Cu-0 (2212). The crystal had the orthorhombic cell with the lattice parameters: a= 5.407 A, b= 5.410 i\, ~~30.762 A, wave vectors of modulation q'= +S b\*+c\*, where 6~0.2 1, A new observation is diffuse spots locate
Single-crystal, stage-1 IBi2Sr2CaCu2Os+ x was synthes~zext. X-ray diffraction patterns indicate that upon intercalation, the c-axis correlation length decrea.,,,s substantially, but the in-plane host layer structure appears to remain unchanged. The compounds exhibit resonance Raman scattering. Raman