X-ray diffraction studies of high-Tc Bi2Sr2CaCu2O8−x superconductor
✍ Scribed by L.A. Novomlinsky; B.Zh. Narymbetov; V.Sh. Shekhtman
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 407 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
The present work reports new features of an X-ray diffraction pattern from Bi-Sr-Ca-Cu-0 (2212). The crystal had the orthorhombic cell with the lattice parameters: a= 5.407 A, b= 5.410 i, ~~30.762 A, wave vectors of modulation q'= +S b*+c*, where 6~0.2 1, A new observation is diffuse spots located between satellite reflections and whose position can be described by the vectors, analogous to those of satellite reflections with the origin on the position of forbidden reflections. A possible mechanism for the occurrence of these diffuse spots is proposed.
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Single-crystal, stage-1 IBi2Sr2CaCu2Os+ x was synthes~zext. X-ray diffraction patterns indicate that upon intercalation, the c-axis correlation length decrea.,,,s substantially, but the in-plane host layer structure appears to remain unchanged. The compounds exhibit resonance Raman scattering. Raman
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