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An improved model of “generation width” for pulsed MOS C-t transient analysis

✍ Scribed by Xiumiao Zhang

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 387 KB
Volume: 33
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(90)90091-r

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