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Improved analysis of pulsed C-t measurements on silicon MOS capacitors: K. S. Rabbani, J. L. Pennock and D. R. Lamb. Solid-St. Electron. 21, 1577 (1978)


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
116 KB
Volume
19
Category
Article
ISSN
0026-2714

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