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An Improved Method for the Extraction of the X-Ray Absorption Atomic Background at the Zr K-Edge

✍ Scribed by Wang, Wen-Cai ;Chen, Yu


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
190 KB
Volume
168
Category
Article
ISSN
0031-8965

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✦ Synopsis


We present a method of data processing suitable to decrease the effects of multi-electron excitations in Zr K-edge EXAFS spectra. The information of the multi-electron excitation can be extracted and used for the correction of the atomic absorption background. We measured and analyzed several Zr K-edge X-ray absorption spectra in pure metals, compounds and glasses. The method efficiently reduces the non-structural peak in the low R range of a radial structural function. The importance of eliminating the effects of the multi-electron excitation is discussed. wy issledovli metod orotki dnnyh dl¾ Zr KEkr¾ spektry tonkoj struktury rentE genovskogo poglo §eni¾D qtoy oslit5 vli¾nie mnogoClektronnogo vozuwdeni¾F snE formi¾ o mnogoClektronnom vozuwdenii mowet izvlekt5s¾ i primen¾ets¾ n poE prvke fon tomnogo poglo §eni¾F wy izmerili i nlizirovli nekotorye Zr KEkr¾ spektry rentgenovskogo poglo §eni¾ v qistom metlleD soedineni¾h i st¿klhF Btot metod Cffektivno podvl¾et nestrukturnye pik v nizkoj R olsti rdil5noj funkii strukturyF rktuets¾ o vwnosti sniweni¾ vli¾ni¾ mnogoClektronnogo vozuwdeni¾F


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