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An improved lumped capacitance method for dielectric measurement

✍ Scribed by A. Lian; W. Zhong

Book ID: 104818455
Publisher: Springer
Year: 1990
Tongue: English
Weight: 488 KB
Volume: 25
Category: Article
ISSN: 0022-2461
DOI: 10.1007/bf00581094

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