An improved electron diffraction instrument
โ Scribed by M.J. Columbe; S.P. Newberry
- Publisher
- Elsevier Science
- Year
- 1954
- Tongue
- English
- Weight
- 123 KB
- Volume
- 4
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
A simple cathodoluminescence (CL) attachment to a JEOL JSM-840 scanning electron microscope (SEM) is described. It is based on a Si photodiode mounted inside the SEM chamber. The current amplifier of a backscattered electron detector unit, which is a standard feature of this SEM, is used to amplify
An easily constructed reciprocating device for the X-ray examination of working electrodes is described, and an example is given of its application to the study of electrodeposited layers. RCsum&Un dispositif facile ii assembler permet d'obtenir in situ les intensitks relatives des diagrammes de di