An electronic slave hammer is used to improve the performance of impact testing. The electronic programmer as well as the power electronic circuits are presented. The geometry of the piston tip of the hammer and on duration of contact between the tip and the structure is discussed. It is shown that
Cathodoluminescence attachment to an electron probe instrument
β Scribed by Yacobi, B. G. ;Herrington, C. R.
- Publisher
- Wiley (John Wiley & Sons)
- Year
- 1986
- Tongue
- English
- Weight
- 356 KB
- Volume
- 3
- Category
- Article
- ISSN
- 0741-0581
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β¦ Synopsis
A simple cathodoluminescence (CL) attachment to a JEOL JSM-840 scanning electron microscope (SEM) is described. It is based on a Si photodiode mounted inside the SEM chamber. The current amplifier of a backscattered electron detector unit, which is a standard feature of this SEM, is used to amplify and display the CL images. Examples of CL panchromatic (integral) images of GaAs, InP, and ZnS crystals are presented.
Cathodoluminescence, GaAs, InP, ZnS
π SIMILAR VOLUMES
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