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An Impact Ionization Model for Two-Dimensional Device Simulation

✍ Scribed by Thurgate, T.; Chan, N.

Book ID: 119798431
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 789 KB
Volume: 20
Category: Article
ISSN: 0018-9200
DOI: 10.1109/jssc.1985.1052309

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