๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

An impact ionization model for two-dimensional device simulation

โœ Scribed by Thurgate, T.; Chan, N.


Book ID
114595071
Publisher
IEEE
Year
1985
Tongue
English
Weight
498 KB
Volume
32
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Device-partition method using equivalent
โœ Chia-Cherng Chang; Szu-Ju Li; Yao-Tsung Tsai ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 375 KB

In order to accomplish two-dimensional device simulation with a large number of nodes, in this paper we propose the device-partition method (DPM) to resolve the problem that the memory size of the simulation environment is insufficient. The idea of DPM is that the device can be divided into several