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An FTIR study of hexamethylenetetramine in porous silicon

โœ Scribed by Yakovlev, V. A. ;Valentini, V. ;Mattei, G.

Book ID
105362326
Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
208 KB
Volume
197
Category
Article
ISSN
0031-8965

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## Abstract Absorption of infrared radiation in the porous silicon (PS) films prepared by common electrochemical etching in DFโ€ethanolโ€D~6~ solutions was studied. We report our results of the effect of deuterium termination on the process of surface states changes of the PS after their exposure to