An experimental procedure for measuring silicon lattice heating due to hot carriers in MOSFETs

✍ Scribed by James W. Roberts; Savvas G. Chamberlain

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 828 KB
• Volume: 36
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(93)90087-7