An experimental procedure for measuring silicon lattice heating due to hot carriers in MOSFETs : James W. Roberts and Savvas G. Chamberlain. Solid-State Electronics, 36(3), 351 (1993)

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 112 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90266-6