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An experimental determination of the carrier lifetime in p-i-n diodes from the stored carrier charge

✍ Scribed by Arnulf Hoffmann; Karl Schuster

Publisher: Elsevier Science
Year: 1964
Tongue: English
Weight: 580 KB
Volume: 7
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(64)90028-0

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