✦ LIBER ✦
An experimental determination of the carrier lifetime near the Si-SiO2 interface : P. C. T. Roberts and J. D. E. Beynon. Solid St. Electron.16 (1973), p. 221
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 108 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.