An experimental 16-Mbit DRAM with reduced peak-current noise

✍ Scribed by Daeje Chin; Changhyun Kim; Yunho Choi; Dong-sun Min; Hong Sun Hwang; Hoon Choi; Sooin Cho; Tae Young Chung; Chan J. Park; Yunseung Shin; Kwangpyuk Suh; Yong E. Park

• Book ID: 119798794
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 964 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.1989.572578