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An evaluation of the lap-shear test for Sn-rich solder/Cu couples: Experiments and simulation

✍ Scribed by N. Chawla; Y. -L. Shen; X. Deng; E. S. Ege

Book ID: 107453170
Publisher: Springer US
Year: 2004
Tongue: English
Weight: 442 KB
Volume: 33
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-004-0102-1

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