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An equivalent circuit for spatial variations in photorefractive materials

✍ Scribed by L. Solymar

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
179 KB
Volume
63
Category
Article
ISSN
0030-4018

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Using a variety of DC and RF measurements of electrical parameters of GaAs MESFETs and the GATES process and device modeling program, we derive distributions of the root process variations. These distributions are then used in GATES Monte Carlo simulations to compute distributions of equivalent-circ