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An Engineering Model for Single-Event Effects and Soft Error Rates in Bulk CMOS

✍ Scribed by Fulkerson, D.E.

Book ID: 114663806
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 542 KB
Volume: 58
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2011.2106801

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